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INVESTIGATION OF RADIATION DAMAGE IN SILICON BY A BACKSCATTERING METHOD.GOETZ G; HEHL K; SCHWABE F et al.1975; RAD. EFFECTS; G.B.; DA. 1975; VOL. 25; NO 1; PP. 27-32; BIBL. 13 REF.Article

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EXPERIMENTAL STUDY OF FOCUSSING OF IONS SCATTERED BY CRYSTALSMASHKOVA ES; MOLCHANOV VA; SERDOBOL'SKAYA TM et al.1976; RAD. EFFECTS; G.B.; DA. 1976; VOL. 28; NO 3-4; PP. 241-243; BIBL. 8 REF.Article

ON THE FORMATION FO VACANCY CLUSTERS IN COPPER IRRADIATED WITH 5 KEV ARGON IONSHERTEL B; DIEHL J.1976; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1976; VOL. 33; NO 2; PP. K73-K75; H.T. 1; BIBL. 9 REF.Article

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